The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 2012
Filed:
Apr. 11, 2008
Weiqi Ding, Fremont, CA (US);
Mingde Pan, Morgan Hill, CA (US);
Wilson Wong, San Francisco, CA (US);
Sergey Shumarayev, Los Altos Hills, CA (US);
Peng LI, Palo Alto, CA (US);
Weiqi Ding, Fremont, CA (US);
Mingde Pan, Morgan Hill, CA (US);
Wilson Wong, San Francisco, CA (US);
Sergey Shumarayev, Los Altos Hills, CA (US);
Peng Li, Palo Alto, CA (US);
Altera Corporation, San Jose, CA (US);
Abstract
Methods and apparatus for gathering information about the eye of a high-speed serial data signal include sampling each bit of a repeating, multi-bit data pattern at several eye slice locations. For any given eye slice location, each bit in the data pattern is compared in voltage to a base line reference signal voltage to establish a reference value for that bit. Then the reference signal voltage is gradually increased while the voltage comparisons are repeated until for some bit a result of the comparing is different than the reference value for that bit. This establishes an upper value for the eye at the eye slice location. The reference signal voltage is then gradually decreased to similarly find a lower value for that eye slice.