The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 07, 2012

Filed:

Jun. 01, 2009
Applicants:

Kyu Takada, Otsu, JP;

Kiyono Tateyama, Hino, JP;

Kentarou Nakamura, Tokyo, JP;

Inventors:

Kyu Takada, Otsu, JP;

Kiyono Tateyama, Hino, JP;

Kentarou Nakamura, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided are an optical pickup apparatus and an objective lens which can record and/or reproduce information for discs with different recording densities and can realize simplification of the structure of themselves and reducing cost. When the expression (1) is satisfied, step differences of a step structure can be further reduced than those in the case that d1=λ1(n−1) holds, and fine grooves corresponding to a steps structure, formed on an optical-surface transfer surface of a mold for molding the objective lens become shallow, to be easily processed. In addition, the moldability is enhanced because the material of the objective lens easily enters the inner portion of the grooves. Further, a fluctuation of a diffraction efficiency caused when wavelength of a light flux changes or temperature changes is reduced so that information can be recorded and/or reduced stably.


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