The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 2012
Filed:
Apr. 03, 2009
Thanh M. Le, Duarte, CA (US);
Nan Yu, Arcadia, CA (US);
Lutfollah Maleki, Pasadena, CA (US);
Anatoliy Savchenkov, Glendale, CA (US);
William H. Steier, San Marino, CA (US);
Thanh M. Le, Duarte, CA (US);
Nan Yu, Arcadia, CA (US);
Lutfollah Maleki, Pasadena, CA (US);
Anatoliy Savchenkov, Glendale, CA (US);
William H. Steier, San Marino, CA (US);
OEwaves, Inc., Pasadena, CA (US);
California Institute of Technology, Pasadena, CA (US);
University of Southern California, Los Angeles, CA (US);
Abstract
Techniques and devices based on transverse magnetic (TM) and transverse electric (TE) modes in an optical resonator or interferometer to provide sensitive optical detection with insensitivity to a change in temperature. A shift in a difference between a first resonance wavelength of a TE optical mode and a second resonance wavelength of a TM optical mode is measured to measure a change in a sample that is in optical interaction with the optical resonator or interferometer. For example, the detected shift can be used to measure a change in a refractive index of the sample.