The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 2012
Filed:
Jan. 16, 2009
Guotong Feng, Mountain View, CA (US);
M. Dirk Robinson, Menlo Park, CA (US);
Guotong Feng, Mountain View, CA (US);
M. Dirk Robinson, Menlo Park, CA (US);
Ricoh Co., Ltd., Tokyo, JP;
Abstract
A class of imaging systems in which the imaging optics, the sensor array and the image processing are related by three parameters: Wthe amount of third order spherical aberration, U the undersampling factor defined as the ratio of the Nyquist frequency of the sensor array divided by the diffraction-limited frequency of the imaging optics, and N the number of rows in the FIR implementation of the image processing. In one aspect, Wis between approximately 2 and 8 waves, U is between approximately 0.05 and 0.30, and N satisfies an equation that defines the acceptable range of N as a function solely of Wand U.