The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 2012
Filed:
Mar. 19, 2009
Daniel W. S. Tam, San Diego, CA (US);
James C. Logan, San Diego, CA (US);
Shing Ted LI, San Diego, CA (US);
Paul Michael Mcginnis, San Diego, CA (US);
Daniel W. S. Tam, San Diego, CA (US);
James C. Logan, San Diego, CA (US);
Shing Ted Li, San Diego, CA (US);
Paul Michael McGinnis, San Diego, CA (US);
The United States of America as represented by the Secretary of the Navy, Washington, DC (US);
Abstract
Methods and systems for determining insertion loss for a mast clamp current probe (MCCP) coupled to a monopole antenna are disclosed. An exemplary method includes determining a first power radiated by the monopole antenna across a first range of frequencies while driving the monopole antenna using a base-feed arrangement to produce a first power-frequency measurement, determining a second power radiated by the monopole antenna across the first range of frequencies while driving the monopole antenna using an MCCP-feed arrangement to produce a second power-frequency measurement and to determine impedance mismatch (MM), and determining insertion loss using the first power-frequency measurement, the second power-frequency measurement and the impedance mismatch.