The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 2012
Filed:
Sep. 27, 2010
Applicants:
Jeffrey L. Duerk, Avon Lake, OH (US);
Ajit Shankaranarayanan, San Mateo, CA (US);
Michael Wendt, Erlangen, DE;
Jonathan S. Lewin, Baltimore, MD (US);
Inventors:
Jeffrey L. Duerk, Avon Lake, OH (US);
Ajit Shankaranarayanan, San Mateo, CA (US);
Michael Wendt, Erlangen, DE;
Jonathan S. Lewin, Baltimore, MD (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method and system for improving image quality by correcting errors introduced by rotational motion of an object being imaged is provided. The object is associated with a fiducial mark. The method provides a computer executable methodology for detecting a rotation and selectively reordering, deleting and/or reacquiring projection data.