The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 2012
Filed:
Mar. 05, 2010
Applicants:
Scott W. Indermuehle, Danville, CA (US);
Charles S. Silver, Richmond, CA (US);
James P. Spallas, Alamo, CA (US);
Lawrence P. Muray, Moraga, CA (US);
Inventors:
Scott W. Indermuehle, Danville, CA (US);
Charles S. Silver, Richmond, CA (US);
James P. Spallas, Alamo, CA (US);
Lawrence P. Muray, Moraga, CA (US);
Assignee:
Agilent Technologies, Inc., Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/28 (2006.01); G01N 23/22 (2006.01);
U.S. Cl.
CPC ...
Abstract
A scanning charged particle microscope includes a layered charged particle beam column package; a sample holder; and a layered micro-channel plate detector package located between the column package and the sample holder.