The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 2012
Filed:
Dec. 22, 2006
Applicants:
Christopher Hans Lansford, Austin, TX (US);
Qinghua He, Auburn, AL (US);
Inventors:
Christopher Hans Lansford, Austin, TX (US);
Qinghua He, Auburn, AL (US);
Assignee:
Spansion LLC, Sunnyvale, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
An integrated circuit wafer system includes an integrated circuit wafer, measuring thicknesses of the integrated circuit wafer, calculating a change in temperature ramp rates and thickness offsets for subsequent processing based on the temperature ramp rates for prior processing and the resultant thicknesses, and calculating an average temperature and deposition time for subsequent processing based on calculated changes in temperature ramp rates, coupled with the average temperature, deposition time for prior processing, and the resultant thicknesses.