The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 2012
Filed:
Nov. 27, 2006
Eiichi Tamiya, Kanazawa, JP;
Naoki Nagatani, Hakusan, JP;
Teruko Yui, Kanazawa, JP;
Tatsurou Endou, Nomi, JP;
Ryou Tanaka, Nomi, JP;
Eiichi Tamiya, Kanazawa, JP;
Naoki Nagatani, Hakusan, JP;
Teruko Yui, Kanazawa, JP;
Tatsurou Endou, Nomi, JP;
Ryou Tanaka, Nomi, JP;
Japan Advanced Institute of Science and Technology, Ishikawa, JP;
Bio Device Technologies Co., Ltd., Ishikawa, JP;
Abstract
[PROBLEMS] To reduce the amount of, for example, a capturing antibody to be employed without lowering detection sensitivity. At the same time, to enable the achievement of intense color development or light emission in a determination area even in the case where only a small amount of a labeled antibody is accumulated. To lower the detection limit in the sandwich method. To enlarge the dynamic range in the competition method. [MEANS FOR SOLVING PROBLEMS] A method of analyzing a test substance by an immunological analysis method by using the test substance, a support having a determination area, on which one member selected from a capturing antibody capable of binding specifically to the test substance and a capturing antigen capable of binding specifically to the test substance has been immobilized, and a labeled antibody capable of binding specifically to the test substance, wherein a label having a sensitizing effect has been immobilized on the determination area of the support.