The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8110147 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 07, 2012

Filed:

Apr. 21, 2009
Applicant:

Tatsurou Kawamura, Kyotanabe, JP;

Inventor:

Tatsurou Kawamura, Kyotanabe, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

A specific binding analysis method capable of controlling the amount of specific binding to freely setting the sensitivity, concentration range and the like in an analysis, and a device used therefore are provided. In order to optimize the amount of specific binding, the specific binding analysis method and the device used therefor restrain the amount and velocity of a sample passing, by capillarity, through a detection zone, by controlling the dimensions, ventilation resistance, hydrophilicity and the like in the portion of the device where the sample passes through.


Find Patent Forward Citations

Kawamura, Tatsurou. (2012). Method for analyzing an analyte qualitatively and quantitatively (U.S. Patent No. 8110147). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8110147

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