The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 31, 2012
Filed:
Dec. 04, 2007
Jaekyun Moon, Plymouth, MN (US);
Jihoon Park, San Jose, CA (US);
Jaekyun Moon, Plymouth, MN (US);
Jihoon Park, San Jose, CA (US);
Regents of the University of Minnesota, St. Paul, MN (US);
Abstract
In general, the disclosure describes techniques for detecting and correcting single or multiple occurrences of data error patterns. This disclosure discusses the generation and application of high-rate error-pattern-correcting codes to correct single instances of targeted error patterns in codewords, and to further correct a significant portion of multiple instances of targeted error patterns, with the least redundancy. In accordance with the techniques, a lowest-degree generator polynomial may be constructed that targets a set of dominant error patterns that make up a very large percentage of all observed occurrences of errors. The lowest-degree generator polynomial produces distinct, non-overlapping syndrome sets for the target error patterns. The lowest-degree generator polynomial may be constructed such that no two error patterns within the list of dominant error patterns map to the same syndrome set, and the single occurrence and starting position of any of the target error patterns can be successfully identified.