The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2012

Filed:

Nov. 24, 2009
Applicants:

David J. Kessler, Tampa, FL (US);

David R. Bueno, Cambridge, FL (US);

David Paul Campagna, St Petersburg, FL (US);

Inventors:

David J. Kessler, Tampa, FL (US);

David R. Bueno, Cambridge, FL (US);

David Paul Campagna, St Petersburg, FL (US);

Assignee:

Honeywell International Inc., Morristown, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method to enable an adaptive fault tolerance in a data system is provided. The method includes communicatively coupling a radiation hardened hardware element to at least one interrupt service routine application in a respective at least one processing element, triggering an interrupt service routine by an interrupt signal received from the radiation hardened hardware element at the interrupt service routine application after an execution of a code block by the at least one processing element, and inspecting the internal state of the at least one processing element to determine if an error occurred.


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