The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2012

Filed:

Oct. 30, 2009
Applicants:

Charles J. Carlino, Santa Clara, CA (US);

Hoa Nguyen, San Jose, CA (US);

Jayesh Patel, Santa Clara, CA (US);

Eric Soderberg, Mountain View, CA (US);

Daniel W. Hepner, Saratoga, CA (US);

Inventors:

Charles J. Carlino, Santa Clara, CA (US);

Hoa Nguyen, San Jose, CA (US);

Jayesh Patel, Santa Clara, CA (US);

Eric Soderberg, Mountain View, CA (US);

Daniel W. Hepner, Saratoga, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method, and a corresponding apparatus, implemented on a suitably programmed processor, selects an ideal computer to remove from a computer cluster observing a failure condition. The computer cluster includes multiple computers. The method includes the steps of recording, at each of the computers, health data for each of the computers, computing, at a health timeout, a first health score for each of the computers based on the health data, computing, at a fatal timeout, and based on the first health score, a second health score for each of the computers, and at each of the computers, selecting a computer having the highest health score for removal from the cluster.


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