The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8108413 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 31, 2012

Filed:

Feb. 15, 2007
Applicants:

Gautam Kar, Yorktown Heights, NY (US);

Ruchi Mahindru, Yonkers, NY (US);

Anca Sailer, Scarsdale, NY (US);

Xing Wei, Amherst, MA (US);

Inventors:

Gautam Kar, Yorktown Heights, NY (US);

Ruchi Mahindru, Yonkers, NY (US);

Anca Sailer, Scarsdale, NY (US);

Xing Wei, Amherst, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Techniques are provided for automatically discovering one or more features in free form heterogeneous data. In one aspect of the invention, the techniques include obtaining free form heterogeneous data, wherein the data comprises one or more data items, applying a label to each data item, using the labeled data to build a language model, wherein a word distribution associated with each label can be derived from the model, and using the word distribution associated with each label to discover one or more features in the data, wherein discovering one or more features in the data facilitates one or more operations that use at least a portion of the labeled data.


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