The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2012

Filed:

Jun. 11, 2008
Applicants:

Subashini Balachandran, Sunnyvale, CA (US);

Mihail Corneliu Constantinescu, San Jose, CA (US);

Jan Hendrik Pieper, San Jose, CA (US);

Inventors:

Subashini Balachandran, Sunnyvale, CA (US);

Mihail Corneliu Constantinescu, San Jose, CA (US);

Jan Hendrik Pieper, San Jose, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention provides a method and apparatus for determining sizing of chunk portions in data de-duplication. The method chunks input data into segments where each segment has a first size, assigns an identifier to each of the data segments, assigns an index to each of the identifiers, creates a suffix structure and a longest common prefix structure from the indexes, detects repeated sequences of indexes and non-repeated indexes from the suffix structure and the longest common prefix structure, determines a second size based on said detected repeated sequences and non-repeated indexes, and chunks the input data into a second plurality of data segments each having the second size.


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