The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2012

Filed:

Nov. 07, 2008
Applicant:

John Patrick Cunningham, Saratoga, CA (US);

Inventor:

John Patrick Cunningham, Saratoga, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/18 (2006.01); G06F 17/00 (2006.01); G06N 5/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

Probability densities are calculated. According to an example embodiment, a Gaussian probability density is computed for a set of data representing a multivariate Gaussian distribution (Gaussian) by matching moments of truncated distributions. A distribution is projected onto dimensions of the set of data to generate cavity-local Gaussians. For the set of data, site-local univariate Gaussians are selected so that the moments match cavity-local univariate Gaussians (the moments of the product of the cavity-local Gaussians and the selected site-local univariate Gaussians, match the moments of the product of the cavity-local Gaussians and the cavity-local truncations). The selected site-local univariate Gaussians are aggregated globally to form a new global Gaussian.


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