The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2012

Filed:

Mar. 12, 2009
Applicants:

Thomas D. Sharp, Terrace Park, OH (US);

Richard A. Roth, Ii, Cincinnati, OH (US);

Uriah M. Liggett, Independence, KY (US);

Joseph M. Kesler, Cincinnati, OH (US);

Inventors:

Thomas D. Sharp, Terrace Park, OH (US);

Richard A. Roth, II, Cincinnati, OH (US);

Uriah M. Liggett, Independence, KY (US);

Joseph M. Kesler, Cincinnati, OH (US);

Assignee:

Etegent Technologies, Ltd., Cincinnati, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01);
U.S. Cl.
CPC ...
Abstract

A method, apparatus and program product manage non-destructive evaluation ('NDE') data. NDE data and inspection information for at least a portion of an asset are received and at least one alignment algorithm to align the NDE data to a simulated model of the at least a portion of the asset is determined based upon at least one of the NDE data and the inspection information. The NDE data is automatically aligned to the simulated model with the at least one alignment algorithm and a display representation that visually represents the aligned NDE data on the simulated model is generated.


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