The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 31, 2012
Filed:
Sep. 19, 2008
Applicants:
Gi-young Yang, Gyeonggi-do, KR;
Chi-hwan Lee, Daegu, KR;
Inventors:
Gi-Young Yang, Gyeonggi-do, KR;
Chi-Hwan Lee, Daegu, KR;
Assignee:
Samsung Electronics Co., Ltd., Gyeonggi-Do, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/3205 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of detecting a degradation of a semiconductor device including calculating a first number of first traps accumulated in a gate insulation layer of the semiconductor device over an operation time of the semiconductor device; calculating the second number of second traps accumulated at an interface between the gate insulation layer and a substrate over the operation time; and calculating the degradation of the semiconductor device relative to the operation time using the first number of the first traps and the second number of the second traps.