The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 31, 2012
Filed:
Jan. 26, 2009
Ronald N. Perry, Cambridge, MA (US);
Eric Chan, Belmont, MA (US);
Ronald N. Perry, Cambridge, MA (US);
Eric Chan, Belmont, MA (US);
Mitsubishi Electric Research Laboratories, Inc., Cambridge, MA (US);
Abstract
A method aligns a character to a sampling grid of an image, where an outline of the character is specified by input pen commands. Points and contours of the input pen commands are determined. An orientation of each contour is determined. A first directed acyclic graph (DAG) is constructed indicating a hierarchical relationship of related contours. Radicals are determined using the first DAG. Simple segments of the contours are determined and merged independently for each radical. Segment pairs and their hinted coordinates are determined. The segment pairs are sorted and a second DAG is constructed for the sorted segment pairs. Collisions between the segment pairs are resolved using the second DAG. The segments pairs, x-free points, and y-free points are fitted to the sampling grid independently for each radical and a result of the fitting is stored in output pen commands.