The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2012

Filed:

Jul. 08, 2008
Applicants:

Stefan Hoppe, Amberg, DE;

Joachim Hornegger, Effeltrich, DE;

Günter Lauritsch, Erlangen, DE;

Inventors:

Stefan Hoppe, Amberg, DE;

Joachim Hornegger, Effeltrich, DE;

Günter Lauritsch, Erlangen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to a method for correcting truncation artifacts in a reconstruction method for computed tomography recordings. The projection images are recorded by an x-ray image detector being extended by determining the attenuation of the radiation outside the projection image for pixels. Non-horizontal filter lines are extended by transaxial and axial artificial extension of the x-ray image detector for the purposes of truncation correction. The truncation correction for non-horizontal filter lines being carried out according to a method from at least one of the following groups: truncation correction takes place regardless of the specific location and orientation of the filter lines; truncation correction takes place as a function of the specific position and orientation of the filter lines, with the filter lines themselves being retained; and truncation correction takes place by introducing new modified filter lines, with filtering taking place along offset artificially extended filter lines.


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