The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2012

Filed:

Jan. 20, 2011
Applicants:

Edward Raymond Dowski, Jr., Lafayette, CO (US);

Kenneth Scott Kubala, Boulder, CO (US);

Alan Eugene Baron, Boulder, CO (US);

Inventors:

Edward Raymond Dowski, Jr., Lafayette, CO (US);

Kenneth Scott Kubala, Boulder, CO (US);

Alan Eugene Baron, Boulder, CO (US);

Assignee:

OmniVision Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/36 (2006.01); G06K 9/40 (2006.01); G02B 5/32 (2006.01); G01J 1/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

A biometric optical recognition system includes optics, including a wavefront coding mask, for imaging a wavefront of object to be recognized to an intermediate image, and a detector for detecting the intermediate image. A modulation transfer function detected by the detector contains no zeros such that subsequent task based image processing recognizes the object. A biometric recognition system includes optics for imaging a wavefront of an object to be recognized to a first intermediate image, and a detector for detecting the first intermediate image. The optics include a phase changing element configured for modifying the wavefront such that a modulation transfer function characterizing detection of the first intermediate image contains no zeros such that subsequent task based image processing recognizes the object. In an optical imaging system that includes a solid state detector, a phase-modifying element reduces reflected power from electromagnetic energy incident upon the detector without introducing aberrations.


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