The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2012

Filed:

May. 12, 2004
Applicants:

Dayong Chen, Cary, NC (US);

Dennis Hui, Cary, NC (US);

Inventors:

Dayong Chen, Cary, NC (US);

Dennis Hui, Cary, NC (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 27/22 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus blindly detects a received signal's modulation type characterizing an impairment component of the received signal for each postulated modulation type by determining spatial correlations between In-phase and Quadrature components of the received signal. The blind detection circuit then detects the modulation type based on the characterized impairment component. A metric generator generates a postulation metric for each postulated modulation type based on the characterized impairment component. After evaluating the postulation metrics, an evaluation circuit identifies the postulated modulation type having the best postulation metric as the modulation type of the received signal. According to an exemplary embodiment, the blind detection circuit determines a whitened noise estimate for each postulated modulation type and generates the postulation metrics based on the whitened noise estimate to reduce interference effects in the postulation metrics.


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