The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 31, 2012
Filed:
Aug. 07, 2007
Yasuko Ishii, Tama, JP;
Yasuko Ishii, Tama, JP;
Olympus Corporation, Tokyo, JP;
Abstract
A microscope image pickup system is one having a microscope apparatus enabled to change an observation state by driving one or more optical members, which comprises: an image pickup unit for picking up an image of an observation object; an image process unit for applying an image process to an image picked up by the image pickup unit; an input unit for inputting a process factor of the image process unit, wherein an observation state of the microscope apparatus and/or an image pickup condition of the image pickup unit are set up and an image is picked up so as to pick up an image of an image quality being equal to, or better than, that of an image to which an image process is applied on the basis of the process factor input from the input unit.