The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2012

Filed:

Feb. 12, 2010
Applicant:

Alexandre Loboda, Thornhill, CA;

Inventor:

Alexandre Loboda, Thornhill, CA;

Assignee:

DH Technologies Pte. Ltd., Singapore, SG;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/10 (2006.01); H01J 49/26 (2006.01); B01D 59/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of photo-fragmentation is provided generating a beam of ions from a sample with an ion source, filtering the beam of ions in a filtering region to select desired ions, and photo-fragmenting the desired ions in a photo-fragmentation region having a higher pressure than the filtering region to generate fragment ions predominantly by prompt fragmentation. An apparatus for photo-fragmentation is provided having an ion source configured to generate a beam of ions from a sample, a filtering region for selecting desired ions, a photo-fragmentation region having a higher pressure than the filtering region to generate predominantly prompt fragmentation of the selected desired ions, an inlet for providing gas to the photo-fragmentation region to maintain a pressure in the photo-fragmentation region that is higher than the pressure in the filtering region, and a photon source emitting a beam of light for photo-fragmenting the selected ions in the photo-fragmentation region.


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