The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2012

Filed:

Nov. 19, 2008
Applicant:

Ming Sun, Cherry Hill, NJ (US);

Inventor:

Ming Sun, Cherry Hill, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 31/00 (2006.01); G01N 33/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

A test sample collection device includes a generally elongated sample collection section for collecting and holding a test sample, a handle member having a top half, a bottom half, a test strip located between the top and bottom halves, and an opening formed by the top and bottom halves, and a cap. Prong members fit within the opening of the handle member for releasably connecting the sample collecting section to the handle member. The cap is releasably mounted on the sample collecting section and covers the sample collecting section. Flexible extension members on the cap are used to release the sample collecting section from the handle member. The collecting section includes a plurality of fins and slots for assisting in collecting the test sample. The device also includes windows for magnified viewing of test results and for indicating whether a sufficient amount of the sample has been collected.


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