The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2012

Filed:

May. 25, 2010
Applicants:

Steven E. Ready, Los Altos, CA (US);

William S. Wong, San Carlos, CA (US);

Inventors:

Steven E. Ready, Los Altos, CA (US);

William S. Wong, San Carlos, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B41J 29/393 (2006.01);
U.S. Cl.
CPC ...
Abstract

Printing systems are disclosed that produce homogenous, smooth edged printed patterns (such as integrated circuit (IC) patterns) by separating pattern layouts into discrete design layers having only parallel layout features, and by printing each design layer using individual print solution droplets deposited onto the substrate. A first alignment operation is performed to achieve a specified orientation between the printhead and a first set of alignment marks on the substrate using first image data generated by the imaging sensor of the camera before performing a first print operation, and a second alignment operation to orient the printhead relative to a second set of alignment marks is performed before a second print operation. A first pattern layout portion includes first layout elements aligned parallel to a first reference axis, and the first print operation is performed by making multiple printing passes in a print direction aligned with the first reference axis.


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