The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 24, 2012
Filed:
Feb. 09, 2009
In-ho Choi, Yongin-si, KR;
Woon-sup Choi, Cheonan-si, KR;
Sung-yeol Kim, Yongin-si, KR;
Young-ki Kwak, Cheonan-si, KR;
Jae-il Lee, Yongin-si, KR;
Chul-woong Jang, Cheonan-si, KR;
Ho-sun Yoo, Seongnam-si, KR;
In-su Yang, Seongnam-si, KR;
Seung-ho Jang, Cheonan-si, KR;
In-ho Choi, Yongin-si, KR;
Woon-sup Choi, Cheonan-si, KR;
Sung-yeol Kim, Yongin-si, KR;
Young-ki Kwak, Cheonan-si, KR;
Jae-il Lee, Yongin-si, KR;
Chul-woong Jang, Cheonan-si, KR;
Ho-sun Yoo, Seongnam-si, KR;
In-su Yang, Seongnam-si, KR;
Seung-ho Jang, Cheonan-si, KR;
Samsung Electronics Co., Ltd., Gyeonggi-do, KR;
Abstract
A field mounting-type test apparatus and method for enhancing competitiveness of a product by simulating various test conditions including a mounting environment for improving quality reliability of a memory device and by minimizing overall loss due to change in a mounting environment thus reducing testing time and cost. The field mounting-type test apparatus includes a mass storage device configured to store logic data simulating a mounting environment of a device under test (DUT) and a tester main frame configured to test the DUT using the logic data.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile