The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 24, 2012

Filed:

Jan. 29, 2008
Applicants:

Grady L. Giles, Dripping Springs, TX (US);

Brian Hoang, Seattle, WA (US);

Timothy J. Wood, Austin, TX (US);

Inventors:

Grady L. Giles, Dripping Springs, TX (US);

Brian Hoang, Seattle, WA (US);

Timothy J. Wood, Austin, TX (US);

Assignee:

GLOBALFOUNDRIES Inc., Grand Cayman, KY;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A processor having a pipelined test access mechanism (TAM). The processor includes a plurality of processor cores. Each of the processor cores includes a scan chain including plurality of serially-coupled scan elements. The processor further includes the pipelined TAM, which includes a plurality of pipeline stages each corresponding to one of the plurality of processor cores. The pipelined TAM includes a command channel, a scan data input (SDI) channel, a scan data output (SDO) channel, and a compare channel. Each pipeline stage is operable to convey commands to its corresponding processor core via the command channel, to convey scan input data to its corresponding processor core via the SDI channel, to receive scan output data conveyed from the corresponding processor core to the SDO channel and the compare channel, and convey compare data downstream via the compare channel, wherein the compare data is based on the scan output data.


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