The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 24, 2012

Filed:

Sep. 05, 2009
Applicants:

Gary Carlson, Alison Viejo, CA (US);

Jeffrey Norris, Lake Forest, CA (US);

Xiaokun HU, Irvine, CA (US);

Daniel Masters, Mission Viejo, CA (US);

Timothy Elmore, Cypress, CA (US);

Sylvester Yu, Anaheim, CA (US);

Inventors:

Gary Carlson, Alison Viejo, CA (US);

Jeffrey Norris, Lake Forest, CA (US);

Xiaokun Hu, Irvine, CA (US);

Daniel Masters, Mission Viejo, CA (US);

Timothy Elmore, Cypress, CA (US);

Sylvester Yu, Anaheim, CA (US);

Assignee:

EADS North America, Inc., Irvine, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A test systemthat can accept a plurality of plug-in electronic cards in Xi Slotsor PXI slotsis described. The test or source measure switching systemincludes a sequencer or sequence enginewhich is fully capable of executing opcode instructions having potentially indefinite completion times and monitoring multiple asynchronous inputs simultaneously without interrupts. The sequenceris sequential and deterministic to approximately ten microsecond resolution.


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