The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 24, 2012

Filed:

Dec. 10, 2007
Applicant:

Peter Frazier, Ithica, NY (US);

Inventor:

Peter Frazier, Ithica, NY (US);

Assignee:

Teradata US, Inc., Dayton, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/00 (2006.01); G06F 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of estimating the average response time and average I/O size that can be used as an alternative for or addition to existing response time and I/O estimation techniques. One method involves initializing values for an average response time and an average I/O size, and initializing an angle. Measurements of the I/O size and response times are received. The technique involves adjusting the average I/O size using the current value of the average I/O size and the received I/O size measurement. The average response time is adjusted using the current value for the average response time and the received response time measurement. The angle value is adjusted using the adjusted average I/O size, the current angle value and the I/O size and time measurements. The slope and y-intercept of a line, formed by plotting the average I/O size verses response time, can then be reported.


Find Patent Forward Citations

Loading…