The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 24, 2012
Filed:
Dec. 28, 2007
Kil MO Koo, Gyeonggi-do, KR;
Ko Ryuh Kim, Daejeon, KR;
Dong Ha Kim, Daejeon, KR;
Sunhee Park, Daejeon, KR;
Soo Yong Park, Daejeon, KR;
Kwang IL Ahn, Daejeon, KR;
Yong Mann Song, Daejeon, KR;
Young Choi, Daejeon, KR;
Hee Yong Kang, Daejeon, KR;
Joon Eon Yang, Daejeon, KR;
Jae Joo Ha, Daejeon, KR;
Sang Baik Kim, Daejeon, KR;
Kil Mo Koo, Gyeonggi-do, KR;
Ko Ryuh Kim, Daejeon, KR;
Dong Ha Kim, Daejeon, KR;
Sunhee Park, Daejeon, KR;
Soo Yong Park, Daejeon, KR;
Kwang il Ahn, Daejeon, KR;
Yong Mann Song, Daejeon, KR;
Young Choi, Daejeon, KR;
Hee Yong Kang, Daejeon, KR;
Joon Eon Yang, Daejeon, KR;
Jae Joo Ha, Daejeon, KR;
Sang Baik Kim, Daejeon, KR;
Abstract
The present invention relates to a negative pulse transient signal analysis methods and negative pulse transient signal analysis module for a PC base simulation equivalent circuit capable of grasping and improving error causes through an abnormal signal analysis after configuring a simulation equivalent circuit for a 4˜20 mA instrument unsatisfied in a temperature environmental impact assessment.