The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 24, 2012
Filed:
Mar. 12, 2008
Peter James Duffett-smith, Cambridge, GB;
Robert Willem Rowe, Cambridge, GB;
Murray Robert Jarvis, Cambridge, GB;
Simon David Hern, Cambridge, GB;
Nicolas Guy Albert Graube, Cambridge, GB;
Peter James Duffett-Smith, Cambridge, GB;
Robert Willem Rowe, Cambridge, GB;
Murray Robert Jarvis, Cambridge, GB;
Simon David Hern, Cambridge, GB;
Nicolas Guy Albert Graube, Cambridge, GB;
Cambridge Positioning Systems Limited, Cambridge, GB;
Abstract
In a terminalhaving a receiverfor receiving the signals from plural transmission sources-whose positions and transmission time offsets are unknown within the terminal, a method is provided for determining the change in the time (elapsed time) at the terminal between two instants. At a first position of the terminal a first set of measurements, aligned to a first instant, of a signal parameter representative of the time or phase of receipt of said signals from said plural transmission sources relative to one or more of them, or to a reference, or to a terminal clock is obtained. Then at a second position of the terminal a corresponding second set of measurements, aligned to a second instant, of a signal parameter representative of the time or phase of receipt of said signals from said plural transmission sources relative to one or more of them, or to the reference, or to the terminal clock is also obtained. The aligned measurements of the first and second sets are combined, and the time elapsed between the first and second instants is calculated from the change in the combined aligned measurements of the first and second sets.