The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 24, 2012
Filed:
Aug. 29, 2005
André Lalonde, Allen, TX (US);
André Lalonde, Allen, TX (US);
Finisar Corporation, Sunnyvale, CA (US);
Abstract
Optical test apparatus. A test apparatus for testing transmitter or receiver devices. The test apparatus includes a transmitter source configured to connect to an optical transmitter. A wide band, wide area optical detector is adapted to optically couple to the optical transmitter powered by the transmitter source. A filter is connected to the optical detector. The filter is configured to separate AC and DC portions of a signal received from the optical detector. A true RMS converter is connected to the filter. The filter is configured to convert an AC noise signal received from the filter to a function of an RMS value of the AC noise signal received from the optical detector. A data acquisition system is connected to the true RMS converter. The data acquisition system is configured to characterize noise characteristics of the transmitter source.