The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 24, 2012
Filed:
Mar. 13, 2003
Konstantin Anisimovich, Moscow, RU;
Vadim Tereshchenko, Moscow, RU;
Vladimir Rybkin, Moscow, RU;
Dmitry Vnuchkov, Moscow, RU;
Konstantin Anisimovich, Moscow, RU;
Vadim Tereshchenko, Moscow, RU;
Vladimir Rybkin, Moscow, RU;
Dmitry Vnuchkov, Moscow, RU;
Abbyy Software Ltd., Nicosia, CY;
Abstract
The present invention discloses a multilevel method of bitmapped image analysis that comprises a whole image data representation via its components—objects of different levels of complexity—hierarchically connected therebetween by spatially-parametrical links. The said method comprises preliminarily generating a classifier of the objects that possibly may be present in the image consisting of one or more levels differing in complexity; parsing the image into objects; attaching each object to one of predetermined levels; establishing hierarchical links between objects of different levels; establishing links between objects within the same level; and performing an object feature analysis. The objects feature analysis comprises at least generating and examining a hypothesis about object features and correcting the object's features of the same and other levels in response to the hypothesis examination results. The step of object features analysis may also comprise execution of a recursive RX-cut within the same level.