The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 24, 2012
Filed:
Feb. 23, 2010
Allen Olson, San Diego, CA (US);
Dirk G. Soenksen, Carlsbad, CA (US);
Kiran Saligrama, San Diego, CA (US);
Allen Olson, San Diego, CA (US);
Dirk G. Soenksen, Carlsbad, CA (US);
Kiran Saligrama, San Diego, CA (US);
Aperio Technologies, Inc., Vista, CA (US);
Abstract
Systems and methods for assessing and optimizing virtual microscope slide image quality are provided. In order to determine whether a virtual slide image has any out of focus areas and is therefore a candidate for manual inspection, the various focus points used to scan the virtual slide image are used to calculate a best fit surface for the virtual slide image. The distance of each focus point from the best fit surface is then calculated and the largest distance is compared to a predetermined value. If the largest distance from a focus point to the best fit surface is larger than the predetermined value, then the virtual slide image is designated as needing a manual inspection and possible re-scan.