The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 24, 2012
Filed:
Jun. 21, 2007
Jan Boese, Eckental, DE;
Estelle Camus, Mountain View, CA (US);
Marcus Pfister, Bubenreuth, DE;
Thomas Redel, Poxdorf, DE;
Jan Boese, Eckental, DE;
Estelle Camus, Mountain View, CA (US);
Marcus Pfister, Bubenreuth, DE;
Thomas Redel, Poxdorf, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
There is described an analysis method for at least one image data record of an examination object, wherein each image data record features a multiplicity of image data elements. A position in a multidimensional space is assigned to each image data element. Each image data element features an image data value. The image data values of positionally corresponding image data elements of the image data records are specified by means of at least essentially positionally identical regions of the examination object. A computer automatically divides the image data records into empty regions and signal regions, applying an overall assignment rule which is based on the image data values of the image data elements of a plurality of image data records, such that each image data element of each image data record is assigned to either its empty region or its signal region. For each image data record, the computer automatically determines a closed outline which fully contains the signal region of the relevant image data record and, on the basis of the closed outline of the relevant image data record, determines an analysis region such that a further analysis of the relevant image data record can be restricted to its analysis region.