The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 24, 2012

Filed:

May. 09, 2008
Applicants:

Helmut Becker-ross, Berlin, DE;

Michael Okruss, Potsdam, DE;

Stefan Florek, Berlin, DE;

Inventors:

Helmut Becker-Ross, Berlin, DE;

Michael Okruss, Potsdam, DE;

Stefan Florek, Berlin, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to a spectrometer arrangement () having a spectrometer for producing a spectrum of radiation from a radiation source on a detector (), comprising an optical imaging Littrow arrangement () for imaging the radiation entering the spectrometer arrangement () in an image plane, a first dispersion arrangement () for the spectral decomposition of a first wavelength range of the radiation entering the spectrometer arrangement, a second dispersion arrangement () for the spectral decomposition of a second wavelength range of the radiation entering the spectrometer arrangement, and a common detector () arranged in the image plane of the imagine optics, characterized in that the imaging optical arrangement () comprises an element () that can be moved between two positions (), wherein the radiation entering the spectrometer arrangement in the first position is guided via the first dispersion arrangement and in the second position via the second dispersion arrangement.


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