The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 24, 2012
Filed:
Nov. 21, 2008
Jitsunari Kojima, Tokyo, JP;
Jitsunari Kojima, Tokyo, JP;
Olympus Corporation, Tokyo, JP;
Abstract
This is a microscope observation system comprising a microscope, a camera unit, a light-amount adjustment unit for controlling adjustment parts included the microscope in order to suppress the amount of reflected light of a specimen image formed on the camera unit, a camera adjustment unit for controlling an adjustment part group of the camera unit in order to adjust image signals photo-electrically converted by the camera unit to a desired state, a light measurement unit for measuring the brightness of the specimen, a display unit for displaying a captured image, a control unit for controlling continuous display speed indicating the continuous display interval of an image continuously displayed on the display unit and at least one of an observation position shifting unit for changing the observation position or observation magnification of the specimen or an observation state detection unit for detecting the observation position or the observation magnification.