The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 24, 2012

Filed:

Jan. 26, 2009
Applicants:

Ronald N. Perry, Cambridge, MA (US);

Eric Chan, Belmont, MA (US);

Inventors:

Ronald N. Perry, Cambridge, MA (US);

Eric Chan, Belmont, MA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06T 11/00 (2006.01); G09G 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method aligns a character to a sampling grid of an image. An original uniform width path that traces a skeleton of the character is specified by input pen commands having original coordinates. The width of the original path is rounded to a nearest integer to produce a hinted width. The original path is traversed using the input pen commands to identify segments of the path. The segments are stored in an array. Hinted coordinates are determined for each segment in the array. The array is sorted, and a directed acyclic graph (DAG) is constructed. Collisions between the segments are resolved using the sorted array, the DAG, and the width of the hinted path. The segments are fitted to the sampling grid, and the result is stored in output pen commands, thereby aligning the skeleton of the character to the sampling grid.


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