The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 24, 2012

Filed:

Nov. 21, 2008
Applicant:

Chih-ming Liao, Taoyuan, TW;

Inventor:

Chih-Ming Liao, Taoyuan, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/033 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides a calibration method of projection effect. The calibration method of projection effect according to the invention comprises the following steps. The first, step (a) is performed to make an optical navigation system move along a predetermined trace relative to an object plane. Then, step (b) is performed to sense the predetermined trace by a sensor to obtain a projection trace. The next, step (c) is performed to calculate a projection effect value according to the included angle between a reflected light and the object plane. Finally, step (d) is performed to calibrate the projection trace with the projection effect value to obtain a calibration trace which is in proportion to the predetermined trace.


Find Patent Forward Citations

Liao, Chih-Ming. (2012). Calibration method of projection effect (U.S. Patent No. 8102371). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8102371

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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