The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 24, 2012
Filed:
Apr. 03, 2009
Franz Bitzer, Friedrichshafen, DE;
Franz Bitzer, Friedrichshafen, DE;
ZF Friedrichshafen AG, Friedrichshafen, DE;
Abstract
A method of detecting a useful signal from a measurement signal that is overlaid by at least one interference signal for use in a control or regulating device, where the interference signal occurs with at least one known interference signal frequency. The method including the steps of detecting the measurement signal, performing a Fourier transformation on the measurement signal with reference to the interference signal frequency to detect the interference signal amplitude and phase, detecting the interference signal on the basis of the interference signal amplitude and phase, and removing the interference signal from the measurement signal to detect the useful signal. The Fourier transformation is performed only with reference to the known interference signal frequency to simplify the computation making it possible to detect the useful signal in real time.