The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 24, 2012

Filed:

Sep. 16, 2009
Applicants:

Unto Kulma, Vantaa, FI;

Jaakko Olavi Uusalo, Klaukkala, FI;

Antti Paavola, Tampere, FI;

Johanna Hansen, Kingston, CA;

Gertjan Hofman, Vancouver, CA;

Inventors:

Unto Kulma, Vantaa, FI;

Jaakko Olavi Uusalo, Klaukkala, FI;

Antti Paavola, Tampere, FI;

Johanna Hansen, Kingston, CA;

Gertjan Hofman, Vancouver, CA;

Assignee:

Honeywell International Inc., Morristown, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
D21H 17/67 (2006.01); D21F 7/00 (2006.01); G01N 23/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

Ash composition measurements of calcium carbonate and gypsum in paper is accomplished with a dual X-ray sensor system with one X-ray source that is powered at about 5.9 KV and a second X-ray source that is powered at about 4.2 KV. Corresponding detectors measure radiation from the respective X-ray sources that is emitted from the paper. Data derived from the measurements yields the gypsum and crystal water content in the paper. The dual X-ray sensor system can be employed in conjunction with infrared total moisture measurements of paper products being manufactured on a papermaking making machine, which contain gypsum and calcium carbonate, in order to correct for the gypsum crystal water effect.


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