The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 24, 2012

Filed:

Nov. 22, 2006
Applicants:

Karsten Hiltawsky, Garching b. Munchen, DE;

Christopher R. Hazard, Niskayuna, NY (US);

Feng Lin, Niskayuna, NY (US);

Inventors:

Karsten Hiltawsky, Garching b. Munchen, DE;

Christopher R. Hazard, Niskayuna, NY (US);

Feng Lin, Niskayuna, NY (US);

Assignee:

General Electric Company, Niskayuna, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 8/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Ultrasound data of a biological tissue is acquired in a relaxed state and a tensed state. A strain is estimated directly from the relaxed state ultrasound data and the tensed state ultrasound data by way of an imaginary part of a complex correlation function. In estimating the strain, the tensed state ultrasound data is re-stretched, and the imaginary part of the complex correlation function is calculated from this re-stretched ultrasound data and the relaxed state ultrasound data. A slope factor is also calculated, and the strain is estimated from this slope factor and the imaginary part of the complex correlation function.


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