The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 24, 2012

Filed:

Oct. 21, 2009
Applicants:

Ariel Friedlander, Mequon, WI (US);

Jonathan Richard Schmidt, Wales, WI (US);

Thomas Louis Toth, Brookfield, WI (US);

Inventors:

Ariel Friedlander, Mequon, WI (US);

Jonathan Richard Schmidt, Wales, WI (US);

Thomas Louis Toth, Brookfield, WI (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 18/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and systems are generally described for measuring a voltage used by an imaging system to generate radiation used in imaging. In embodiments, different datasets are acquired using different degrees of attenuation of the radiation. The differently attenuated datasets are processed to derive a ratio of the differential attenuation. The attenuation ratio is processed to derive a measure of the voltage used by the imaging system to generate the radiation used to acquire the different datasets.


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