The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 24, 2012

Filed:

Nov. 20, 2007
Applicants:

Hirokazu Karasawa, Yokohama, JP;

Hideo Isobe, Kawasaki, JP;

Inventors:

Hirokazu Karasawa, Yokohama, JP;

Hideo Isobe, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 29/265 (2006.01); G01N 29/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

An ultrasonic inspection apparatus includes an ultrasonic probe including an ultrasonic transducer, a position detection device, a drive element selector which is connected to the plurality of piezoelectric elements of the ultrasonic transducer provided so as to select a required piezoelectric element, a signal detection circuit which allows the piezoelectric element selected by the drive element selector to transmit ultrasonic wave to an inspection object through an acoustic transmission medium, which receives reflection echo thereof, and which detects an electric signal of the reflection echo through, a signal processor which generates three-dimensional imaging data inside of the inspection object by processing the electric signal of the detected reflection echo, a position converting circuit which outputs an imaging-start trigger signal to a signal generator in response to a position detection signal, and a display device which displays an imaging result.


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