The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 17, 2012
Filed:
Oct. 17, 2006
Hoa Tran, Escondido, CA (US);
Anita Richards, San Juan Capistrano, CA (US);
Douglas Brown, Rancho Santa Fe, CA (US);
Choung Kim, Torrance, CA (US);
Hoa Tran, Escondido, CA (US);
Anita Richards, San Juan Capistrano, CA (US);
Douglas Brown, Rancho Santa Fe, CA (US);
Choung Kim, Torrance, CA (US);
Teradata US, Inc., Dayton, OH (US);
Abstract
Techniques are presented for skew exception detection within a parallel processing environment. A potential exception is detected when a highest load of a processor within the parallel processing environment exceeds an average load within the parallel processing environment by a given threshold. The potential exception can become a legitimate exception when it exists for a qualified period or time or when it exists and no qualified period of time is noted. In an embodiment, checks for the potential exception occur and are wholly contained within a given configurable interval.