The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 17, 2012

Filed:

Apr. 15, 2009
Applicants:

Jiunn Wen Chan, Penang, MY;

James G. Schleicher, Ii, Los Gatos, CA (US);

Kamal Patel, Campbell, CA (US);

Inventors:

Jiunn Wen Chan, Penang, MY;

James G. Schleicher, II, Los Gatos, CA (US);

Kamal Patel, Campbell, CA (US);

Assignee:

Altera Corporation, San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/45 (2006.01);
U.S. Cl.
CPC ...
Abstract

In an example embodiment, an EDA program receives input which includes a selection as to an FPGA die and its device package and a selection as to a structured ASIC die and its device package. If the I/O pins on the device package for the FPGA differ from the I/O pins on the device package for the structured ASIC, the EDA program determines a correspondence between the I/O pins on the two device packages (e.g., by identifying the location of the pads for I/O pins on the structured ASIC die and/or creating a virtual structured ASIC device package whose I/O pins are a superset of the I/O pins on the selected structured ASIC device package), which determination includes checking rules for resource assignments. The EDA program then stores the determined correspondence in a device database where the determined correspondence can be accessed by CAD algorithms.


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