The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 17, 2012

Filed:

Feb. 11, 2009
Applicants:

Daniel Adam Warren, San Jose, CA (US);

John Joseph Sullivan, Sunnyvale, CA (US);

Inventors:

Daniel Adam Warren, San Jose, CA (US);

John Joseph Sullivan, Sunnyvale, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01);
U.S. Cl.
CPC ...
Abstract

Systems and methods are disclosed for a self-testing power management unit (PMU) in an electronic device. Self-testing may enable the testing of PMU power supply outputs while reducing the need for test points to conserve circuit board real estate. In one embodiment, a PMU is placed in self-test mode, and a test controller may perform capacitance tests on each power supply output. Once the capacitance test has been performed on each power supply output, the PMU may be placed in normal operating mode, and voltage tests may be performed on each power rail. Once voltage tests have been performed on all power rails in the PMU, the self-test may be complete. In some embodiments, the test controller may communicate with a test multiplexer to select the power supply output for testing. Further, the measurements resulting from the capacitance and voltage tests may be converted to a digital signal through an analog-to-digital converter on the PMU.


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