The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 17, 2012

Filed:

Apr. 24, 2003
Applicants:

Simon C. Borst, Amsterdam, NL;

Krishnan Kumaran, Scotch Plains, NJ (US);

Kavita Ramanan, Hoboken, NJ (US);

Philip A. Whiting, New Providence, NJ (US);

Inventors:

Simon C. Borst, Amsterdam, NL;

Krishnan Kumaran, Scotch Plains, NJ (US);

Kavita Ramanan, Hoboken, NJ (US);

Philip A. Whiting, New Providence, NJ (US);

Assignee:

Alcatel Lucent, Paris, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 40/00 (2009.01);
U.S. Cl.
CPC ...
Abstract

Techniques and systems for planning of wireless networks are described. A system according to an aspect of the present invention receives inputs describing traffic statistics for a wireless network and computes network specifications. The system uses the traffic statistics and network specifications as inputs to a computationally tractable model used to compute parameters for the user level performance of the wireless network. The model may suitably be a processor sharing queuing model. The model employed by the planning system allows analytical solution for the desired user level parameters, given the characteristics and conditions entered as inputs and the intended network layout characteristics. Once a set of user level performance parameters has been computed, the values of the parameters are examined to determine if they meet predetermined requirements, in an iterative process continuing until a set of specifications has been developed that produces parameters meeting the requirements.


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