The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 17, 2012
Filed:
Jan. 08, 2009
Dug Young Kim, Gwangju, KR;
IN Hee Shin, Gwangju, KR;
Dong Ju Lee, Gwangju, KR;
Gwangju Institute of Science and Technology, Gwangju, KR;
Abstract
The present invention relates to an apparatus for measuring a residual stress of an optical fiber. More particularly, the present invention relates to an apparatus for measuring residual stress of an optical fiber which is provided with a variable polarizer of which rotation is unnecessary instead of a rotary analyzer to measure the residual stress in high resolution and at high speed. There is provided an apparatus for measuring a residual stress of an optical fiber including a light generation unit that generates light; a lens unit that converts the generated light into collimated light; a polarization unit including variable polarization devices that divide the collimated light into two perpendicularly polarized light beams and control phase retardation of the polarized light beams by means of an electrical signal; a measurement unit that allows the divided light beams of two polarization states to penetrate an optical fiber to be measured; and a light detection unit that detects the polarization states of the light beams penetrating the optical fiber.